Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2009-01-29
2010-10-19
Nghiem, Michael P (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S065000
Reexamination Certificate
active
07818137
ABSTRACT:
A test circuit for fast determination of device capacitance variation statistics provides a mechanism for determining process variation and parameter statistics using low computing power and readily available test equipment. A test array having individually selectable devices is stimulated under computer control to select each of the devices sequentially. A test output from the array provides a current or voltage that dependent on a particular device parameter. The sequential selection of the devices produces a voltage or current waveform, characteristics of which are measured using a digital multi-meter that is interfaced to the computer. The rms value of the current or voltage at the test output is an indication of the standard deviation of the parameter variation and the DC value of the current or voltage is an indication of the mean value of the parameter.
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Agarwal Kanak B.
Hayes Jerry D.
Nassif Sani R.
Harris Andrew M.
International Business Machines - Corporation
Mitch Harris Atty at Law, LLC
Nghiem Michael P
Toub Libby Z.
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