Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2007-07-31
2007-07-31
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S180000, C708S208000
Reexamination Certificate
active
11460591
ABSTRACT:
A circuit for computing moment pre-products for statistical analysis reduces data transfer volume for on-chip statistical measurements. The circuit calculates the sums of multiple exponentiations of outputs of one or more measurement circuits, thereby reducing the amount of data that must be transferred from a wafer. An integer scaling of the input data is arranged between zero and unity so that the exponentiations all similarly lie between zero and unity. The circuit can use look-up tables and adder/accumulators to accumulate the contributions of each measurement to each exponentiation, or use a multiplier arrangement to determine the contributions. The multipliers can be implemented in the adder/accumulators by clocking the adder/accumulators by corresponding counts determined from the measurement data and lower-order exponentiations. Ranges of the measurement values are determined by capturing maximum and minimum values using comparators as the measurements are input.
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Harris Andrew M.
Mitch Harris Atty at Law, LLC
Salys Casimer K.
Wachsman Hal
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