4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Sang-Man Byun

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Bit line sense amplifier and method thereof

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Parallel bit test circuit and method for semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor memory device capable of storing data of...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Semiconductor memory device for testing redundancy cells

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3126326

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