4. Excavating

Sadami Takeoka

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Database for designing integrated circuit device, and method...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Functional block for integrated circuit, semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method and apparatus for generating test pattern for sequential

Excavating
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Method for evaluating delay test quality

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Method for generating test pattern for semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-976914

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