4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Lumped type parameters

Rosario J. Consiglio

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Electrostatic discharge test structure system and method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent

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Method for optimizing the structure of a transistor to withstand

Electricity: measuring and testing – A material property using electrostatic phenomenon – For flaw detection
Patent

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Process tolerant NMOS transistor for electrostatic discharge pro

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Patent

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Pulse circuit using a transmission line

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent

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Transmission line pulser discharge circuit

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
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Profile ID: LFUS-PAI-P-1366754

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