Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1994-06-10
1996-05-21
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324676, 324765, 324602, 333 20, G01R 2726
Patent
active
055193277
ABSTRACT:
A pulse discharge circuit for pulse testing an integrated-circuit device under test (DUT) is provided which uses three separate switching relays S1, S2, and S3, which are operated in a predetermined sequence. For charging the capacitance of a pulse-forming transmission line, the relay contact of S1 is closed while the relay contacts of relays S2, S3 are both open. For discharging the charge on the transmission line to form a test pulse, the relay contact of S1 is first opened, and the relay contact of S2 is then closed while the relay contact of S3 is open. After each test pulse is generated and applied to a DUT, the condition of the DUT is determined by a leakage current measurement. The relay contact S2 is opened to isolate the pulse generator circuit and then the relay contact S3 is closed.
REFERENCES:
"ESD On CHMOS Devices--Equivalent Circuits, Physical Models And Failure Mechanisms" by N. Khurana, T. Maloney, W. Yeh, Sep. 1985 Intel Corporation IEEE/IRPS, pp. 212-223.
Do Diep
King Patrick T.
VLSI Technology Inc.
Wieder Kenneth A.
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