4. Semiconductor device manufacturing: process
  5. Coating with electrically or thermally conductive material
  6. To form ohmic contact to semiconductive material

Ronald Gene Filippi

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Aluminum-based metallization exhibiting reduced...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Capacitive monitors for detecting metal extrusion during...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Reexamination Certificate

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Control of liner thickness for improving thermal cycle...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Control of liner thickness for improving thermal cycle...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method and structure for determining thermal cycle reliability

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
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Profile ID: LFUS-PAI-P-2493136

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