4. Electricity: measuring and testing
  5. Fault detecting in electric circuits and of electric components
  6. Of individual circuit component or element

Ronald G. Filippi

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Detection of residual liner materials after polishing in...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Detection of residual liner materials after polishing in...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate

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Device interconnection

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Electrically porous on-chip decoupling/shielding layer

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Electrically programmable fuse and fabrication method

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Having fuse or integral short
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Profile ID: LFUS-PAI-P-328155

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