4. Semiconductor device manufacturing: process
  5. Coating with electrically or thermally conductive material
  6. To form ohmic contact to semiconductive material

Rodney Kistler

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Apparatus and methods for detecting transitions of wafer...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate

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Complementary sensors metrological process and method and...

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
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Enhancement of eddy current based measurement capabilities

Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
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Infrared end-point detection system

Abrading – Precision device or process - or with condition responsive... – Computer controlled
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Integration of sensor based metrology into semiconductor...

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – For liquid etchant
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Profile ID: LFUS-PAI-P-2301084

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