4. Single-crystal, oriented-crystal, and epitaxy growth processes;
  5. Forming from vapor or gaseous state
  6. Fully-sealed or vacuum-maintained chamber

Robert Tyler Leonard

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Double side polished wafer scratch inspection tool

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Double side polished wafer scratch inspection tool

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Low micropipe 100 mm silicon carbide wafer

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – Fully-sealed or vacuum-maintained chamber
Reexamination Certificate

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Low micropipe 100 mm silicon carbide wafer

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – Fully-sealed or vacuum-maintained chamber
Reexamination Certificate

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One hundred millimeter high purity semi-insulating single...

Stock material or miscellaneous articles – Composite – Of inorganic material
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2352147

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