4. Fishing, trapping, and vermin destroying

Robert L. Duffin

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Measuring integrity of semiconductor multi-layer metal structure

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
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Multiple step metallization process

Fishing – trapping – and vermin destroying
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Structure and method for metallization of semiconductor devices

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Patent

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Structure and method for metallization of semiconductor devices

Fishing – trapping – and vermin destroying
Patent

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