4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Rath Ung

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Method and apparatus for selectively accessing and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Random access memory including circuit to compress...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Random access memory including first and second voltage sources

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Test parallelism increase by tester controllable switching...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Test parallelism increase by tester controllable switching...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2399162

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