Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2007-11-20
2007-11-20
Lamarre, Guy (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S719000, C714S714000, C714S734000, C714S743000, C714S025000, C714S030000, C365S201000
Reexamination Certificate
active
11175280
ABSTRACT:
A method and apparatus according to the present invention enable wafer chips to be configured with a single power on and off sequence and further enable a chip parameter to be adjusted during a wafer test without utilizing that sequence. In particular, each wafer chip under test is assigned a unique programmable identification. Once each chip has been assigned a corresponding identification, the chips may each be individually accessible by that identification to provide parameter values to chip registers to configure that chip. The configured chips may be subsequently tested in parallel to evaluate the parameter settings. In addition, the present invention enables chips to share data I/O pins or lines, thereby reducing the quantity of testing machine pins utilized for each chip and enabling a greater quantity of chips to be tested in a parallel fashion.
REFERENCES:
patent: 6161205 (2000-12-01), Tuttle
patent: 6357025 (2002-03-01), Tuttle
patent: 6622102 (2003-09-01), Skidmore
patent: 6830941 (2004-12-01), Lee et al.
patent: 6845478 (2005-01-01), Luong
patent: 6853317 (2005-02-01), Kim et al.
patent: 6883151 (2005-04-01), Tsao et al.
patent: 7131033 (2006-10-01), Roper et al.
patent: 2004/0006404 (2004-01-01), McAdams et al.
patent: 2005/0028058 (2005-02-01), Pemer
patent: 2005/0082664 (2005-04-01), Funaba et al.
patent: 2005/0099201 (2005-05-01), Ferreira et al.
Fuhrmann Dirk
Perry Robert
Rehm Norbert
Ung Rath
Zieleman Jan
Edell Shapiro & Finnan LLC
Infineon - Technologies AG
Lamarre Guy
Trimmings John P
LandOfFree
Method and apparatus for selectively accessing and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for selectively accessing and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for selectively accessing and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3844298