Random access memory including first and second voltage sources

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator

Reexamination Certificate

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C365S189110

Reexamination Certificate

active

11236933

ABSTRACT:
A random access memory including first memory cells, second memory cells, a first voltage source, and a second voltage source. The first voltage source is configured to control the first memory cells. The second voltage source is configured to control the second memory cells. Also, the first voltage source is configured to be trimmed independently of the second voltage source to provide a first voltage that reduces leakage from the first memory cells and the second voltage source is configured to be trimmed independently of the first voltage source to provide a second voltage that reduces leakage from the second memory cells.

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patent: 5703827 (1997-12-01), Leung et al.
patent: 6341087 (2002-01-01), Kunikiyo
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patent: 2004/0046188 (2004-03-01), Itoh et al.
patent: 2005/0018483 (2005-01-01), Imamiya et al.
patent: 2007/0041232 (2007-02-01), Zimlich

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