Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2005-12-21
2008-11-25
Nguyen, Van Thu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S189070
Reexamination Certificate
active
07457177
ABSTRACT:
A random access memory including an array of memory cells configured to store memory cell data, a first circuit, and a second circuit. The first circuit is configured to compare test data and memory cell data to obtain comparison results. The second circuit is configured to compress the comparison results and store the compressed comparison results.
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Fuhrmann Dirk
Perry Rob
Rehm Norbert
Ung Rath
Zieleman Jan
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
Nguyen Van Thu
Sofocleous Alexander
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