4. Coherent light generators
  5. Particular active media
  6. Semiconductor

Randall S. Geels

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Determining wafer orientation in spectral imaging

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

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Method and apparatus for high-speed thickness mapping of...

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

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Method for replicating periodic nonlinear coefficient patterning

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Liquid phase epitaxial growth
Patent

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Passivation and protection of a semiconductor surface

Coherent light generators – Particular active media – Semiconductor
Patent

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Passivation and protection of semiconductor surface

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Packaging or treatment of packaged semiconductor
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Profile ID: LFUS-PAI-P-100290

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