4. Electricity: measuring and testing
  5. Measuring, testing, or sensing electricity, per se
  6. With rotor

Phillip D. Burlison

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Dynamic mask memory for serial scan testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Dynamically reconfigurable precision signal delay test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Dynamically reconfigurable precision signal delay test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Dynamically reconfigurable precision signal delay test...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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High speed I.sub.DDQ monitor circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Gating – Delay controlled switch
Patent

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Profile ID: LFUS-PAI-P-769716

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