Dynamic mask memory for serial scan testing

Details Dynamic mask memory for serial scan testing Dynamic mask memory for serial scan testing

2011-01-04

2011-01-04

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

Reexamination Certificate

active

07865788

ABSTRACT:
A failure mask memory is added to a semiconductor tester. In conjunction with a new failure filter, failures may be ignored or used to update the contents of failure mask memory. Only the first instance of a failure is reported reducing the size of test data logs.

REFERENCES:
patent: 5956352 (1999-09-01), Tatosian et al.
patent: 7257750 (2007-08-01), Singh et al.
patent: 7437624 (2008-10-01), Miller et al.
patent: 7584386 (2009-09-01), Bancel et al.
patent: 7620876 (2009-11-01), Lewis et al.
patent: 2007/0288821 (2007-12-01), Matsuo et al.

Affiliated with

Also associated with

Rating

Dynamic mask memory for serial scan testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Dynamic mask memory for serial scan testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Dynamic mask memory for serial scan testing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2742272