Dynamically reconfigurable precision signal delay test...

Details Dynamically reconfigurable precision signal delay test... Dynamically reconfigurable precision signal delay test...

2006-03-14

2006-03-14

Dildine, R. Stephen (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S731000

Reexamination Certificate

active

07013417

ABSTRACT:
A programmable time event and waveform generator for the application of precise timing patterns to a logic circuit and the capture of response data from the logic circuit. The time event and waveform generator comprises a programmable delay element that is programmed with values stored in pattern memory. For scan based testing, the time event and waveform generator is programmed between test pattern scan sequences by serial loading from the test pattern memory. The generator may be used to generate precise signal transitions to input pins of a circuit under test, and to capture at precise times the signal states from the output pins of a circuit under test. The data for programming the delay element is accessed from test pattern memory.

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