4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Philips Semiconductors Inc.

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Analog test access port and method therefor

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Arrangement for DRAM cell using shallow trench isolation

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Concurrent serial interconnect for integrating functional...

Electrical computers and digital data processing systems: input/ – Intrasystem connection – Bus access regulation
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Digital reverberation processor and method for generating...

Electrical computers and digital processing systems: memory – Storage accessing and control
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Electrically planar upper electrode cover

Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With microwave gas energizing means
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Profile ID: LFUS-PAI-P-2018084

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