Olivier Parriaux

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Defraction photoelectric position measuring system

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Diffraction photoelectric displacement measuring device

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Force meter with optical waveguide integrated in a substrate

Patent

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Method of coupling an optical fiber to an optoelectronic compone

Optical waveguides – With optical coupler – Particular coupling structure
Patent

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Optical polarizing device and laser polarization device

Optical: systems and elements – Diffraction – From grating
Reexamination Certificate

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Profile ID: LFUS-PAI-P-119988

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