4. Stock material or miscellaneous articles
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  6. Of quartz or glass

Norihiko Tsuchiya

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Defect-position identifying method for semiconductor substrate

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Dielectrically isolated substrate and method for manufacturing t

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Including dielectric isolation means
Patent

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Method for evaluating an SOI substrate, evaluation...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Method of growing thin film on semiconductor substrate and its m

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With a step of measuring – testing – or sensing
Patent

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Method of manufacturing a substrate having shallow trench...

Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
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Profile ID: LFUS-PAI-P-856356

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