Delay calculating method in semiconductor integrated circuit

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S108000, C716S113000, C716S134000

Reexamination Certificate

active

07925998

ABSTRACT:
An input pin capacitance of a cell is obtained in advance in a function expression, and a delay is calculated in such manner that the input pin capacitance is calculated in functions of an input slew and a drive load capacitance in each instance. In a cell characterizing process, a total volume of a current running into an input terminal before a voltage value of the input terminal reaches a reference voltage is obtained so that a value approximate to a real input pin capacitance can be obtained.

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