4. Excavating

Noboru Okino

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Analyzing device for saving semiconductor memory failures

Excavating
Patent

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Memory testing method and memory testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Pattern generator

Excavating
Patent

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Semiconductor memory testing method and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Sequential logic circuit device

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons
Patent

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Profile ID: LFUS-PAI-P-842997

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