Memory testing method and memory testing apparatus

Details Memory testing method and memory testing apparatus Memory testing method and memory testing apparatus

2005-04-05

2005-04-05

Chung, Phung My (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S718000, C365S201000

Reexamination Certificate

active

06877118

ABSTRACT:
A memory testing method and apparatus are provided, which can test in short time a flash memory. In case of testing a flash memory having block function, in a memory testing method and apparatus in which a predetermined logical value is written in memory cells constituting each of blocks of the memory, the written logical value is read out from the memory cells to compare it with an expected value, and a decision that, when the read-out logical value and the expected value do not coincide with each other, such memory cell is a failure memory cell, a decision is rendered that, when the number of failure memory cells in each block reaches a predetermined number, such block is a bad block, and the test of such block is stopped. In addition, a decision is rendered that, when the number of failure memory cells on the same address line reaches a predetermined number, such address line is a bad address line, and after such decision has rendered, the test of memory cells on the bad address line is substantially not effected.

REFERENCES:
patent: 5271015 (1993-12-01), Akiyama
patent: 5539699 (1996-07-01), Sato
patent: 5717694 (1998-02-01), Ohsawa
patent: 5956350 (1999-09-01), Irrinki et al.
patent: 5978949 (1999-11-01), Terayama
patent: 5983374 (1999-11-01), Todome et al.
patent: 6009028 (1999-12-01), Akiyama
patent: 6499119 (2002-12-01), Orita et al.
patent: 6601198 (2003-07-01), Goko
patent: 07073700 (1995-03-01), None
patent: 10125092 (1998-05-01), None

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