4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Niranjan Behera

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Memory having a redundancy scheme to allow one fuse to blow...

Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate

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Method and apparatus to change the amount of redundant...

Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate

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Method and apparatus to reduce the amount of redundant...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Method and system for testing a dual-port memory at speed in...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Statistical yield of a system-on-a-chip

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2349194

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