4. Semiconductor device manufacturing: process
  5. With measuring or testing
  6. Electrical characteristic sensed

Nga-Ching Wong

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active

Dielectric memory cell structure with counter doped channel...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Lateral doped channel

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Method for forming a dielectric spacer in a non-volatile...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Method for manufacturing a double bitline implant

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate

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Method for measuring source and drain junction depth in...

Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2530375

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