Multi-test method for using compare MISR

Details Multi-test method for using compare MISR Multi-test method for using compare MISR

2005-05-23

2009-12-08

Ellis, Kevin L (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S726000, C714S728000, C714S732000, C714S738000

Reexamination Certificate

active

07631237

ABSTRACT:
Systems and methods for performing logic built-in-self-tests (LBISTs) where data comparisons are performed in the MISR. In one embodiment, a STUMPS-type LBIST architecture includes scan chains interposed between portions of the functional logic of the logic circuit. Test bit patterns are scanned into the scan chains, propagated through the functional logic, and captured in scan chains following the functional logic. The bits are scanned out of the scan chains into a self-compare MISR that creates a signature from the computed bit patterns and then compares the signature of the computed bit patterns with an expected signature, giving a pass/fail result. This single bit result reduces the bandwidth required to communicate the result(s) of the LBIST testing to the test equipment. As a result, a larger number of devices can be tested by a given piece of test equipment.

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