4. Optics: measuring and testing
  5. Dimension
  6. Area

Mitsuru Nakata

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Electronic device improved in heat radiation performance for...

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate

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Manufacturing method of thin film device substrate

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Subsequent separation into plural bodies
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Manufacturing method of thin film device substrate

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
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Method and apparatus for irradiating laser

Optics: measuring and testing – Dimension – Area
Reexamination Certificate

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Method of and apparatus for manufacturing semiconductor thin...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2208067

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