Optics: measuring and testing – Dimension – Area
Reexamination Certificate
2011-04-05
2011-04-05
Nguyen, Sang (Department: 2886)
Optics: measuring and testing
Dimension
Area
C356S425000, C356S408000, C356S388000, C356S398000, C438S014000
Reexamination Certificate
active
07920277
ABSTRACT:
A laser irradiation process includes: scanning a substrate with laser having a predetermined lasing frequency at different irradiation intensities to form a plurality of first irradiation areas corresponding to the irradiation intensities; illuminating the first irradiation areas to reflected light receive from the first irradiation areas; determining microcrystallization intensity based on the received reflected light; and determining irradiation intensity based on the thus determined microcrystallization intensity. The laser irradiation process uses the irradiation intensity for irradiating a polycrystalline film in a product semiconductor device.
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Kanoh Hiroshi
Nakata Mitsuru
Shimamoto Hirofumi
Dickstein & Shapiro LLP
NEC Corporation
NEC LCD Technologies Ltd.
Nguyen Sang
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