4. Static information storage and retrieval
  5. Read/write circuit
  6. Having fuse element

Ming-Jing Ho

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Integrated circuit with ESD protection circuit

Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate

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Method of analyzing DRAM redundancy repair

Radiant energy – Photocells; circuits and apparatus – With circuit for evaluating a web – strand – strip – or sheet
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Method of manufacturing mask read-only memory cell

Static information storage and retrieval – Floating gate – Particular biasing
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Method of manufacturing mask read-only memory cell

Static information storage and retrieval – Systems using particular element – Capacitors
Reexamination Certificate

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Semiconductor device and method for repairing failed memory...

Static information storage and retrieval – Read/write circuit – Bad bit
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Profile ID: LFUS-PAI-P-2029085

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