4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Bulk effect device
  6. Bulk effect switching in amorphous material

Ming-Hsiang Hsueh

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Chalcogenide random access memory and method of fabricating...

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate

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Current constricting phase change memory element structure

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate

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Current constricting phase change memory element structure

Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate

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Method of fabricating non-volatile memory

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation
Reexamination Certificate

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Method of refreshing charge-trapping non-volatile memory...

Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2319647

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