4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Michael J. Tripp

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Automatic self test of an integrated circuit component via...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Device testing

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
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Memory addressing structural test

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Memory cell structural test

Static information storage and retrieval – Addressing – Multiplexing
Reexamination Certificate

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Method and apparatus for testing a logic device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2616774

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