4. Static information storage and retrieval
  5. Floating gate
  6. Particular biasing

Matthew J. Breitwisch

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CMOS device having retrograde n-well and p-well

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Embedded one-time programmable non-volatile memory using...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Etching of tungsten selective to titanium nitride

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate

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Isolated fully depleted silicon-on-insulator regions by...

Active solid-state devices (e.g. – transistors – solid-state diode – Regenerative type switching device – With extended latchup current level
Reexamination Certificate

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Method and design for measuring SRAM array leakage macro (ALM)

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2167146

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