4. Electricity: measuring and testing
  5. Magnetic
  6. Magnetometers

Masatoshi Yasutake

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AFM tweezers, method for producing AFM tweezers, and...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Alignment assembly for aligning a spring element with a laser be

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Patent

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Analyzing method and apparatus for minute foreign substances, an

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Patent

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Analyzing method and apparatus for minute foreign...

Semiconductor device manufacturing: process – With measuring or testing – Optical characteristic sensed
Reexamination Certificate

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Cantilever for vertical scanning microscope and probe for...

Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate

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Profile ID: LFUS-PAI-P-558560

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