Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2008-06-20
2011-10-04
Larkin, Daniel (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
C850S005000, C850S018000, C850S040000, C850S052000, C850S056000, C850S057000, C850S060000, C850S063000, C977S962000
Reexamination Certificate
active
08028567
ABSTRACT:
AFM tweezers that include a first probe, including a triangular prism member having a tip of a ridge which is usable as a probe tip in a scanning probe microscope, and a second probe, including a triangular prism member provided so as to open/close with respect to the first probe, are provided. The first probe and the second probe are juxtaposed such that a predetermined peripheral surface of the triangular prism member of the first probe and a predetermined peripheral surface of the triangular prism member of the second probe face substantially in parallel to each other, and the first probe formed of a notch that prevents interference with a sample when the sample is scanned by the tip of the ridge.
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IEEJ Trans. SM, “Development of AFM Tweezers for Manipulation of Nanometer Size Objects”, vol. 125, No. 11, (2005) with partial translation of Figure 2 (Eight (8) pages).
Kobayashi Tatsuya
Suzuki Masato
Umemoto Takeshi
Yasutake Masatoshi
AOI Electronics Co., Ltd.
Crowell & Moring LLP
Larkin Daniel
SII Nano Technology Inc.
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