4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Manfred Proell

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DRAM memory with a shared sense amplifier structure

Static information storage and retrieval – Read/write circuit – Flip-flop used for sensing
Reexamination Certificate

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Integrated DRAM semiconductor memory and method for...

Static information storage and retrieval – Read/write circuit – Precharge
Reexamination Certificate

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Integrated memory

Static information storage and retrieval – Read/write circuit – Flip-flop used for sensing
Reexamination Certificate

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Integrated semiconductor memory and method for operating an...

Static information storage and retrieval – Addressing – Particular decoder or driver circuit
Reexamination Certificate

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Integrated semiconductor memory circuit and a method for...

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2296896

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