4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Signal converting, shaping, or generating
  6. Synchronizing

Makoto Hatakenaka

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active

Field effect transistor array including doped two-cell isolation

Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – Having specific type of active device
Patent

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Information device including main processing circuit,...

Electrical computers and digital data processing systems: input/ – Intrasystem connection – Bus interface architecture
Reexamination Certificate

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Line delay generator using one-port RAM

Computer graphics processing and selective visual display system – Computer graphics display memory system – Graphic display memory controller
Reexamination Certificate

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Memory circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Method of testing a semiconductor memory device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-428876

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