4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Louis Bernard Bushard

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Apparatus for implementing eFuse sense amplifier testing...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Implementing enhanced LBIST testing of paths including arrays

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Memory array manufacturing defect detection system and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Memory array manufacturing defect detection system and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Method and apparatus for testing a ring of non-scan latches...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2392777

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