4. Thermal measuring and testing
  5. Thermal testing of a nonthermal quantity

Liang-Gi Yao

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Alignment mark configuration

Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks
Reexamination Certificate

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Anti-reflection oxynitride film for polysilicon substrates

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate

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Anti-reflection oxynitride film for tungsten-silicide substrates

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation
Patent

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Atomic layer deposition

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate

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Chemical vapor deposition (CVD) method employing wetting...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate
Reexamination Certificate

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Profile ID: LFUS-PAI-P-111968

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