4. Facsimile and static presentation processing
  5. Static presentation processing
  6. Attribute control

Kozo Nakahata

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Apparatus and method of pattern detection based on a scanning tr

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Bit pattern generator

Boots – shoes – and leggings
Patent

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Inspection method for soldered joints using x-ray imaging and ap

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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Method and apparatus for inspection of solder joints by x-ray fl

X-ray or gamma ray systems or devices – Specific application – Lithography
Patent

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Pattern checking apparatus

Image analysis – Histogram processing – For setting a threshold
Patent

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Profile ID: LFUS-PAI-P-181826

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