4. Data processing: measuring, calibrating, or testing
  5. Testing system
  6. Of circuit

Kevin R. Lensing

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Determining die test protocols based on process health

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate

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Method and apparatus for characterizing an interconnect...

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Method and apparatus for classifying faults based on wafer...

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate

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Method and apparatus for comparing device and non-device...

Semiconductor device manufacturing: process – Including control responsive to sensed condition
Reexamination Certificate

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Method and apparatus for compensating metrology data for...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
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Profile ID: LFUS-PAI-P-2224116

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