4. Electricity: measuring and testing
  5. Impedance, admittance or other quantities representative of...
  6. Parameter related to the reproduction or fidelity of a...

Kenneth P. Rodbell

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Apparatus and method for testing semiconductors

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Balancing
Reexamination Certificate

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Automatic exchange of degraders in accelerated testing of...

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate

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Computer program products for determining stopping powers of...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate

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Device interconnection

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Dual channel d.c. low noise measurement system and test methodol

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent

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Profile ID: LFUS-PAI-P-137906

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