Automatic exchange of degraders in accelerated testing of...

Details Automatic exchange of degraders in accelerated testing of... Automatic exchange of degraders in accelerated testing of...

2007-02-27

2007-02-27

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C209S573000

Reexamination Certificate

active

10734694

ABSTRACT:
Issues that are addressed in accordance with at least one presently preferred embodiment of the present invention, are: improvements upon the time it takes to physically swap degraders (done previously by hand); the safety involved in doing so, since the degraders become highly radioactive; possible improved energy resolution and beam stability if the accelerator can be left running continuously; and in-situ monitoring of beam current, beam position and stability. Particularly contemplated are methods and arrangements for changing degraders automatically, not manually, and in a safe manner.

REFERENCES:
patent: 5584395 (1996-12-01), Homma
patent: 5850145 (1998-12-01), Burroughs et al.
patent: 6433336 (2002-08-01), Jongen et al.
patent: 6621261 (2003-09-01), Tsuchiya
patent: 2005/0134256 (2005-06-01), Cheng et al.

Affiliated with

Also associated with

Rating

Automatic exchange of degraders in accelerated testing of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Automatic exchange of degraders in accelerated testing of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Automatic exchange of degraders in accelerated testing of... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3880097