4. Radiant energy
  5. Inspection of solids or liquids by charged particles
  6. Electron probe type

Kenichi Kadota

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Analysis method for semiconductor device, analysis system...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate

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Aqueous water repellent for substrate treatment, making...

Coating processes – Immersion or partial immersion – Cellulosic base
Reexamination Certificate

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Failure detection system, failure detection method, and...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate

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Linear pattern detection method and apparatus

Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate

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Method for analyzing fail bit maps of wafers

Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2168193

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