4. Static information storage and retrieval
  5. Read/write circuit
  6. Testing

Jun Etoh

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Address multiplexed dynamic RAM having a test mode capability

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Dynamic RAM device having a separate test mode capability

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Dynamic random access memory capable of fast erasing of storage

Static information storage and retrieval – Read/write circuit – Erase
Patent

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Dynamic type semiconductor monolithic memory

Static information storage and retrieval – Read/write circuit – Precharge
Patent

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Ferroelectric memory

Static information storage and retrieval – Systems using particular element – Ferroelectric
Patent

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Profile ID: LFUS-PAI-P-65998

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