4. Semiconductor device manufacturing: process
  5. Having magnetic or ferroelectric component

José R Diaz

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Angular rate sensor and method of manufacturing the same

Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
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Barrier dielectric stack for seam protection

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
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Barrier dielectric stack for seam protection

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Bipolar transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure
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BJT and method for fabricating the same

Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure
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Profile ID: LFUS-PAI-P-2355463

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