4. Electricity: electrical systems and devices
  5. Safety and protection of systems and devices
  6. Load shunting by fault responsive means

Jose A. Maiz

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Apparatus and method for adiabatically heating a...

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate

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Electrostatic discharge protection circuit

Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
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Metal-metal oxide etch stop/barrier for integrated circuit...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Method and apparatus for forming metal-metal oxide etch...

Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate

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Methods of forming electromigration and thermal gradient...

Semiconductor device manufacturing: process – Making device array and selectively interconnecting – Using structure alterable to nonconductive state
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Profile ID: LFUS-PAI-P-975879

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