4. Optics: measuring and testing
  5. Shape or surface configuration
  6. By specular reflection

Jordan Valley Semiconductors Ltd.

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Broad band referencing reflectometer

Optics: measuring and testing – Infrared and ultraviolet
Reexamination Certificate

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Control of X-ray beam spot size

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Control of X-ray beam spot size

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Control of X-ray beam spot size

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Curved X-ray reflector

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
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