4. Static information storage and retrieval
  5. Floating gate
  6. Particular biasing

John Kubodera

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Automatic bitline-latch loading for flash prom test

Static information storage and retrieval – Read/write circuit – With shift register
Reexamination Certificate

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Characterizing circuit performance by separating device and...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Column redundancy scheme for non-volatile flash memory using...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Column redundancy scheme for serially programmable...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Electrical fuse for integrated circuits

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2523767

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